Optical monitoring of contamination on high-voltage device

Yan Sun; Wen Bin Zhao; Guan Jun Zhang

Optical monitoring of contamination on high-voltage device

Yan Sun
, Wen Bin Zhao
, Guan Jun Zhang

School of Electrical Engineering

Xi'an Jiaotong University

Research output: Contribution to conference › Paper › peer-review

Abstract

A novel optical sensor for contamination monitoring is proposed. Based on the detection of the light intensity changes due to the contamination in light path, its severe status can be measured. The measurement principle is theoretically described. A principle prototype is set up, and the related experimental results indicate the feasibility of the method.

Original language	English
Pages	443-446
Number of pages	4
State	Published - 2005
Event	2005 International Symposium on Electrical Insulating Materials, ISEIM 2005 - Kitakyushu, Japan Duration: 5 Jun 2005 → 9 Jun 2005

Conference

Conference	2005 International Symposium on Electrical Insulating Materials, ISEIM 2005
Country/Territory	Japan
City	Kitakyushu
Period	5/06/05 → 9/06/05

Cite this

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title = "Optical monitoring of contamination on high-voltage device",

abstract = "A novel optical sensor for contamination monitoring is proposed. Based on the detection of the light intensity changes due to the contamination in light path, its severe status can be measured. The measurement principle is theoretically described. A principle prototype is set up, and the related experimental results indicate the feasibility of the method.",

author = "Yan Sun and Zhao, \{Wen Bin\} and Zhang, \{Guan Jun\}",

year = "2005",

language = "英语",

pages = "443--446",

note = "2005 International Symposium on Electrical Insulating Materials, ISEIM 2005 ; Conference date: 05-06-2005 Through 09-06-2005",

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TY - CONF

T1 - Optical monitoring of contamination on high-voltage device

AU - Sun, Yan

AU - Zhao, Wen Bin

AU - Zhang, Guan Jun

PY - 2005

Y1 - 2005

N2 - A novel optical sensor for contamination monitoring is proposed. Based on the detection of the light intensity changes due to the contamination in light path, its severe status can be measured. The measurement principle is theoretically described. A principle prototype is set up, and the related experimental results indicate the feasibility of the method.

AB - A novel optical sensor for contamination monitoring is proposed. Based on the detection of the light intensity changes due to the contamination in light path, its severe status can be measured. The measurement principle is theoretically described. A principle prototype is set up, and the related experimental results indicate the feasibility of the method.

UR - https://www.scopus.com/pages/publications/25644449721

M3 - 论文

AN - SCOPUS:25644449721

SP - 443

EP - 446

T2 - 2005 International Symposium on Electrical Insulating Materials, ISEIM 2005

Y2 - 5 June 2005 through 9 June 2005

ER -

Optical monitoring of contamination on high-voltage device

Abstract

Conference

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