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Nonlinear analysis on electrical properties in a bended composite piezoelectric semiconductor beam

  • Luke Zhao
  • , Feng Jin
  • , Zhushan Shao
  • , Wenjun Wang
  • Xi'an University of Architecture and Technology
  • Lanzhou University of Technology

Research output: Contribution to journalArticlepeer-review

10 Scopus citations

Abstract

In this paper, the interactions between the transverse loads and the electrical field quantities are investigated based on the nonlinear constitutive relation. By considering a composite beam consisting of a piezoelectric semiconductor and elastic layers, the nonlinear model is established based on the phenomenological theory and Euler’s beam theory. Furthermore, an iteration procedure based on the differential quadrature method (DQM) is developed to solve the nonlinear governing equations. Before analysis, the convergence and correctness are surveyed. It is found that the convergence of the proposed iteration is fast. Then, the transverse pressure induced electrical field quantities are investigated in detail. From the calculated results, it can be found that the consideration of nonlinear constitutive relation is necessary for a beam undergoing a large load. Compared with the linear results, the consideration of the nonlinear constitutive relation breaks the symmetry for the electric potential, the electric field, and the perturbation carrier density, and has little influence on the electric displacement. Furthermore, the non-uniform pressures are considered. The results show that the distributions of the electric field quantities are sensitively altered. It indicates that the electrical properties can be manipulated with the design of different transverse loads. The conclusions in this paper could be the guidance on designing and manufacturing electronic devices accurately.

Original languageEnglish
Pages (from-to)2039-2056
Number of pages18
JournalApplied Mathematics and Mechanics (English Edition)
Volume44
Issue number12
DOIs
StatePublished - Dec 2023

Keywords

  • O343.5
  • composite piezoelectric semiconductor beam
  • differential quadrature method (DQM)
  • electrical property
  • iteration
  • nonlinear constitutive relation

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