New method of three-dimensional profile measurement based on fringe pattern projection

Aimed at the difficulties of extracting the object heights in fringe pattern technology, a new measurement method with ray track was proposed. The corresponding phase relations of project plane SLM with image plane CCD were utilized to determine the measured object height, where it was unnecessary to arrange the system in parallel, to calibrate the parameters of the whole measurement system and to the translate coordinates. This method is suitable for the totally measured fields, and especially for the static and flat objects. The experiments confirm the higher measurement rate, fine flexibility and steady accuracy of this method.