Multi-label X-Ray Imagery Classification via Bottom-Up Attention and Meta Fusion

  • Benyi Hu
  • , Chi Zhang
  • , Le Wang
  • , Qilin Zhang
  • , Yuehu Liu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Scopus citations

Abstract

Automatic security inspection has received increasing interests in recent years. Due to the fixed top-down perspective of X-ray scanning of often tightly packed luggages, such images typically suffer from penetration-induced occlusions, severe object overlapping and violent changes in appearance. For this particular application, few research efforts have been made. To deal with the overlapping in X-ray images classification, we propose a novel Security X-ray Multi-label Classification Network (SXMNet). Our hypothesis is that different overlapping levels and scale variations are the primary challenges in the multi-label classification problem of prohibited items. To address these challenges, we propose to incorporate 1) spatial attention to locate prohibited items despite shape, color and texture variations; and 2) anisotropic fusion of per-stage predictions to dynamically fuse hierarchical visual information under violent variations. Motivated by these, our SXMNet is boosted by bottom-up attention and neural-guided Meta Fusion. Raw input image is exploited to generate high-quality attention masks in a bottom-up way for pyramid feature refinement. Subsequently, the per-stage predictions according to the refined features are automatically re-weighted and fused via a soft selection guided by neural knowledge. Comprehensive experiments on the Security Inspection X-ray (SIXray) and Occluded Prohibited Items X-ray (OPIXray) datasets demonstrate the superiority of the proposed method.

Original languageEnglish
Title of host publicationComputer Vision – ACCV 2020 - 15th Asian Conference on Computer Vision, 2020, Revised Selected Papers
EditorsHiroshi Ishikawa, Cheng-Lin Liu, Tomas Pajdla, Jianbo Shi
PublisherSpringer Science and Business Media Deutschland GmbH
Pages173-190
Number of pages18
ISBN (Print)9783030695439
DOIs
StatePublished - 2021
Event15th Asian Conference on Computer Vision, ACCV 2020 - Virtual, Online
Duration: 30 Nov 20204 Dec 2020

Publication series

NameLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Volume12627 LNCS
ISSN (Print)0302-9743
ISSN (Electronic)1611-3349

Conference

Conference15th Asian Conference on Computer Vision, ACCV 2020
CityVirtual, Online
Period30/11/204/12/20

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