Multi-frequency fringe projection profilometry based on wavelet transform

Based on wavelet transforms (WTs), an alternative multi-frequency fringe projection profilometry is described. Fringe patterns with multiple frequencies are projected onto an object and the reflected patterns are recorded digitally. Phase information for every pattern is calculated by identifying the ridge that appears in WT results. Distinct from the phase unwrapping process, a peak searching algorithm is applied to obtain object height from the phases of the different frequency for a single point on the object. Thus, objects with large discontinuities can be profiled. In comparing methods, the height profiles obtained from the WTs have lower noise and higher measurement accuracy. Although measuring times are similar, the proposed method offers greater reliability.