Mono-crystallinity characterization of relaxor-based ferroelectric crystal PIMNT grown by Bridgman process

Using PIMNT polycrystalline material prepared by solid state method, large size PIMNT crystals were grown by vertical Bridgman process. A series of crystal wafers fabricated from different locations of the crystal boule were measured by the rotating orientation XRD method. By means of the normal scan pattern and butterfly diagram, the single-crystallization of PIMNT crystals was characterized. PIMNT crystal is verified to be perovskite structure by X-ray powder diffraction analysis. The axial direction of the whole crystal boule is parallel to [111] crystalline orientation. The butterfly diagrams show that the crystalline orientation dispersion of the crystal is limited in the range of 1.2°-1.5°. All these results indicate that a mono-crystallinity has been acquired in PIMNT crystal grown in this work.