Molecular dynamics simulation of contact force between sample and AFM tip

Wenchao Tian; Guimin Chen; Huanling Liu

Molecular dynamics simulation of contact force between sample and AFM tip

Wenchao Tian
, Guimin Chen
, Huanling Liu

Xidian University

Research output: Contribution to journal › Article › peer-review

Abstract

Contact between tip of atomic force microscope (AFM) and tested sample surface is simulated using molecular dynamics (MD). Relationship between contact force and gap is analyzed. Surface pressure distribution is discussed. Phenomena of ″jump-to-contact″ and ″neck-separation″ are observed. Hysteresis between contact process and separate process is obtained. Relationship of surface distortion radius with contact force and gap is also discussed. Only atomic layer close to contact area affects the contact force. Surface atoms close to the contact are pressed and those far from the contact are pulled.

Original language	English
Pages (from-to)	150-156
Number of pages	7
Journal	Jisuan Wuli/Chinese Journal of Computational Physics
Volume	27
Issue number	1
State	Published - Jan 2010
Externally published	Yes

Keywords

AFM
Contact force
Molecular dynamics

Cite this

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title = "Molecular dynamics simulation of contact force between sample and AFM tip",

abstract = "Contact between tip of atomic force microscope (AFM) and tested sample surface is simulated using molecular dynamics (MD). Relationship between contact force and gap is analyzed. Surface pressure distribution is discussed. Phenomena of ″jump-to-contact″ and ″neck-separation″ are observed. Hysteresis between contact process and separate process is obtained. Relationship of surface distortion radius with contact force and gap is also discussed. Only atomic layer close to contact area affects the contact force. Surface atoms close to the contact are pressed and those far from the contact are pulled.",

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author = "Wenchao Tian and Guimin Chen and Huanling Liu",

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T1 - Molecular dynamics simulation of contact force between sample and AFM tip

AU - Tian, Wenchao

AU - Chen, Guimin

AU - Liu, Huanling

PY - 2010/1

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N2 - Contact between tip of atomic force microscope (AFM) and tested sample surface is simulated using molecular dynamics (MD). Relationship between contact force and gap is analyzed. Surface pressure distribution is discussed. Phenomena of ″jump-to-contact″ and ″neck-separation″ are observed. Hysteresis between contact process and separate process is obtained. Relationship of surface distortion radius with contact force and gap is also discussed. Only atomic layer close to contact area affects the contact force. Surface atoms close to the contact are pressed and those far from the contact are pulled.

AB - Contact between tip of atomic force microscope (AFM) and tested sample surface is simulated using molecular dynamics (MD). Relationship between contact force and gap is analyzed. Surface pressure distribution is discussed. Phenomena of ″jump-to-contact″ and ″neck-separation″ are observed. Hysteresis between contact process and separate process is obtained. Relationship of surface distortion radius with contact force and gap is also discussed. Only atomic layer close to contact area affects the contact force. Surface atoms close to the contact are pressed and those far from the contact are pulled.

KW - AFM

KW - Contact force

KW - Molecular dynamics

UR - https://www.scopus.com/pages/publications/77649218140

M3 - 文章

AN - SCOPUS:77649218140

SN - 1001-246X

VL - 27

SP - 150

EP - 156

JO - Jisuan Wuli/Chinese Journal of Computational Physics

JF - Jisuan Wuli/Chinese Journal of Computational Physics

IS - 1

ER -

Molecular dynamics simulation of contact force between sample and AFM tip

Abstract

Keywords

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