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MISP-Net: Significantly Reducing Transient Backward Steppings via Novel Multi-step Irregular Sequence Prediction

  • Yichao Dong
  • , Dan Niu
  • , Chao Wang
  • , Zhenya Zhou
  • , Zhou Jin
  • , Changyin Sun
  • Southeast University, Nanjing
  • Huada Empyrean Software Co. Ltd
  • Zhejiang University
  • Anhui University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In the post-layout simulation for large-scale integrated circuits, Transient Analysis (TA), determining the time-domain response over a specified time interval, is essential and time-consuming. Especially, a mass of backward steppings and low simulation efficiency occur without proper settings of Newton-Raphson (NR) initial solution and accurate Local Truncation Error (LTE) estimation. In this work, a novel multi-step irregular sequence prediction model (MISP-Net) is proposed to predict multiple NR initial solutions and precise LTE estimations by just one inference step. This model is constructed by an Irregular Multiple Timesteps Prediction Module (IMTP) and a Irregular Multi-step Solution Prediction Module (IMSP). In IMSP, to improve the irregular prediction performance, a Dual-branch Irregular Feature Pyramid (DIFP) equipped with lightweight Multi-Channel Irregular Time Attention (MITA) are designed. We assess the proposed MISP-Net in the real large-scale industrial circuits on a commercial SPICE simulator. Compared with the commercial SPICE and the SOTA ISPT-Net model, significant backward stepping reductions are achieved: up to 78.57% for NR nonconvergence case and 76.62% for LTE overlimit case, respectively. And the prediction time for NR initial solution in our model is remarkably reduced by up to 5.58× compared to the SOTA ISPT-Net model.

Original languageEnglish
Title of host publication2026 Design, Automation and Test in Europe Conference, DATE 2026 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9783982674117
DOIs
StatePublished - 2026
Externally publishedYes
Event2026 Design, Automation and Test in Europe Conference, DATE 2026 - Verona, Italy
Duration: 20 Apr 202622 Apr 2026

Publication series

NameProceedings -Design, Automation and Test in Europe, DATE
ISSN (Print)1530-1591

Conference

Conference2026 Design, Automation and Test in Europe Conference, DATE 2026
Country/TerritoryItaly
CityVerona
Period20/04/2622/04/26

Keywords

  • feature pyramid
  • irregular attention mechanism
  • irregular sequence prediction
  • Transient analysis

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