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Microwave dielectric properties with optimized Mn-doped Ba 0.6Sr0.4TiO3 highly epitaxial thin films

  • Ming Liu
  • , Chunrui Ma
  • , Greg Collins
  • , Jian Liu
  • , Chonglin Chen
  • , Li Shui
  • , Hong Wang
  • , Chao Dai
  • , Yuan Lin
  • , Jie He
  • , Jiechao Jiang
  • , Efstathios I. Meletis
  • , Qingyu Zhang
  • University of Texas at San Antonio
  • Dalian University of Technology
  • Xi'an Jiaotong University
  • University of Electronic Science and Technology of China
  • University of Texas at Arlington

Research output: Contribution to journalArticlepeer-review

29 Scopus citations

Abstract

Pure and Mn doped Ba0.6Sr0.4TiO3 (0.5%, 2%) (BST) thin films were epitaxially grown on the (001) LaAlO3 using pulsed laser deposition. Microstructural characterizations indicate that the as-grown thin films have excellent single crystalline quality and epitaxial nature with an atomically sharp interface and an interface relationship of [100]film//[100]LAO and (001)film//(001) LAO. Microwave dielectric property measurements indicate that the additional Mn doping can significantly enhance the microwave dielectric properties of the BST films.

Original languageEnglish
Pages (from-to)4221-4223
Number of pages3
JournalCrystal Growth and Design
Volume10
Issue number10
DOIs
StatePublished - 6 Oct 2010
Externally publishedYes

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