Microwave dielectric properties of mn-doped (Ba,Sr)TiO 3//Ba(Zr, Ti)O 3 multilayered thin films: Optimization of designed structure

  • Ming Liu
  • , Chunrui Ma
  • , Jian Liu
  • , Gregory Collins
  • , Chonglin Chen
  • , Feng Xiang
  • , Hong Wang
  • , Jie He
  • , Jiechao Jiang
  • , Efstathios I. Meletis
  • , Amar Bhalla

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

Environment-friendly Ferroelectric Mn:BST//Mn:BZT multilayer with additional 2% Mn doping were epitaxially fabricated on (001) MgO substrates by pulsed laser deposition with same thickness but different stacking periodic numbers or each layer thickness. Microstructure studies by X-ray diffraction and transmission electron microscopy indicate that the multilayer is c-axis oriented with good epitaxial nature. The microwave (∼18GHz) dielectric property measurements show that the dielectric loss tangent rapidly decreases with the increase of each layer thickness. The loss tangent can be lowered down to ∼0.043 at ∼18GHz, which suggests that the Mn:BST//Mn:BZT multilayer system has great potential for the development of room temperature microwave elements and related applications.

Original languageEnglish
Pages (from-to)116-122
Number of pages7
JournalIntegrated Ferroelectrics
Volume150
Issue number1
DOIs
StatePublished - 2 Jan 2014

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