Microwave dielectric properties and Raman spectroscopy of Scheelite solid solution [(Li0.5Bi0.5)1-xCax] MoO4 ceramics with ultra-low sintering temperatures

  • Di Zhou
  • , Hong Wang
  • , Qiu Ping Wang
  • , Xin Guang Wu
  • , Jing Guo
  • , Gao Qun Zhang
  • , Li Shui
  • , Xi Yao
  • , Clive A. Randall
  • , Li Xia Pang
  • , Han Chen Liu

Research output: Contribution to journalArticlepeer-review

36 Scopus citations

Abstract

A Scheelite solid solution was formed based on [(Li0.5Bi 0.5)1-xCax]MoO4 ceramics and prepared via a solid state reaction method in the range 0.0 ≤ x ≤ 1.0. High performance microwave dielectric properties were obtained in the [(Li 0.5Bi0.5)0.15Ca0.85]MoO4 ceramic sintered at 760°C with a relative permittivity of 14.1, a Qf value of 24,000 GHz (at 10.0 GHz), and a temperature coefficient value of +10.7 ppm/°C and the [(Li0.5Bi0.5)0.1Ca 0.9]MoO4 ceramic sintered at 850°C with a relative permittivity of 12.7, a Qf value of 41,300 GHz (at 10.3 GHz), and a temperature coefficient value of -16.5 ppm/°C. X-ray diffraction, Raman spectroscopy and the classical damped oscillator model were applied to study the relationship between the microwave dielectric properties and structures.

Original languageEnglish
Pages (from-to)253-257
Number of pages5
JournalFunctional Materials Letters
Volume3
Issue number4
DOIs
StatePublished - Dec 2010

Keywords

  • Microwave dielectric ceramic
  • Scheelite solid solution
  • low temperature co-fired ceramic

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