Microstructure analysis of ferroelectric BaTiO3/SrTiO3 heterostructures on LaAlO3 substrates by high resolution X-ray diffraction

C. Dai; M. Liu; C. R. Ma; C. L. Chen; Y. Lin

doi:10.1080/00150193.2014.922836

Microstructure analysis of ferroelectric BaTiO₃/SrTiO₃ heterostructures on LaAlO₃ substrates by high resolution X-ray diffraction

C. Dai
, M. Liu
, C. R. Ma
, C. L. Chen
, Y. Lin

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

High-resolution X-ray diffraction has been used to analyze the strain distribution and dislocation densities in epitaxial BaTiO₃/SrTiO₃ heterostructures. It is found that the initial layer in the heterostructures is important to the epitaxial quality and significantly affects the strain distribution, dislocation density, and the lateral coherence length in the heterostructural thin films.

Original language	English
Pages (from-to)	90-98
Number of pages	9
Journal	Ferroelectrics
Volume	470
Issue number	1
DOIs	https://doi.org/10.1080/00150193.2014.922836
State	Published - 25 Oct 2014
Externally published	Yes

Keywords

HRXRD
Heterostructure
dislocation
strain

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10.1080/00150193.2014.922836

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@article{35d49d6fd3ab446da102d87f92a3fb76,

title = "Microstructure analysis of ferroelectric BaTiO3/SrTiO3 heterostructures on LaAlO3 substrates by high resolution X-ray diffraction",

abstract = "High-resolution X-ray diffraction has been used to analyze the strain distribution and dislocation densities in epitaxial BaTiO3/SrTiO3 heterostructures. It is found that the initial layer in the heterostructures is important to the epitaxial quality and significantly affects the strain distribution, dislocation density, and the lateral coherence length in the heterostructural thin films.",

keywords = "HRXRD, Heterostructure, dislocation, strain",

author = "C. Dai and M. Liu and Ma, \{C. R.\} and Chen, \{C. L.\} and Y. Lin",

note = "Publisher Copyright: Copyright {\textcopyright} Taylor \& Francis Group, LLC.",

year = "2014",

month = oct,

day = "25",

doi = "10.1080/00150193.2014.922836",

language = "英语",

volume = "470",

pages = "90--98",

journal = "Ferroelectrics",

issn = "0015-0193",

publisher = "Taylor and Francis Ltd.",

number = "1",

}

TY - JOUR

T1 - Microstructure analysis of ferroelectric BaTiO3/SrTiO3 heterostructures on LaAlO3 substrates by high resolution X-ray diffraction

AU - Dai, C.

AU - Liu, M.

AU - Ma, C. R.

AU - Chen, C. L.

AU - Lin, Y.

PY - 2014/10/25

Y1 - 2014/10/25

N2 - High-resolution X-ray diffraction has been used to analyze the strain distribution and dislocation densities in epitaxial BaTiO3/SrTiO3 heterostructures. It is found that the initial layer in the heterostructures is important to the epitaxial quality and significantly affects the strain distribution, dislocation density, and the lateral coherence length in the heterostructural thin films.

AB - High-resolution X-ray diffraction has been used to analyze the strain distribution and dislocation densities in epitaxial BaTiO3/SrTiO3 heterostructures. It is found that the initial layer in the heterostructures is important to the epitaxial quality and significantly affects the strain distribution, dislocation density, and the lateral coherence length in the heterostructural thin films.

KW - HRXRD

KW - Heterostructure

KW - dislocation

KW - strain

UR - https://www.scopus.com/pages/publications/84908192179

U2 - 10.1080/00150193.2014.922836

DO - 10.1080/00150193.2014.922836

M3 - 文章

AN - SCOPUS:84908192179

SN - 0015-0193

VL - 470

SP - 90

EP - 98

JO - Ferroelectrics

JF - Ferroelectrics

IS - 1

ER -

Microstructure analysis of ferroelectric BaTiO₃/SrTiO₃ heterostructures on LaAlO₃ substrates by high resolution X-ray diffraction

Abstract

Keywords

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