Microelectromechanical systems-based electrostatic field sensor using Pb(Zr, Ti)O3 thin films

  • Takeshi Kobayashi
  • , Syoji Oyama
  • , Masaharu Takahashi
  • , Ryutaro Maeda
  • , Toshihiro Itoh

Research output: Contribution to journalArticlepeer-review

48 Scopus citations

Abstract

We have developed microelectromechanical system (MEMS)-based electrostatic field sensors using Pb(Zr,Ti)O3 thin films. Multilayers of Pt/Ti/PZT/Pt/Ti/SiO2 deposited on silicon-on-insulator (SOI) wafers have been fabricated into the sensors through MEMS microfabrication technology. The resonant frequency of the fabricated sensors is within 1700-1800 Hz. The developed MEMS-based electrostatic field sensors have shown a good linear response to the voltage of an electrified body, which is comparable to that of commercially available electrostatic field sensors.

Original languageEnglish
Pages (from-to)7533-7536
Number of pages4
JournalJapanese Journal of Applied Physics
Volume47
Issue number9 PART 2
DOIs
StatePublished - 19 Sep 2008

Keywords

  • Electric field sensor
  • Electrostatic field sensor
  • MEMS
  • Piezoelectric
  • PZT

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