Mechanical properties of β-Si3N4 thin layers in basal plane under tension: A molecular dynamics study

  • Xuefeng Lu
  • , Meng Chen
  • , Lei Fan
  • , Chao Wang
  • , Hongjie Wang
  • , Guanjun Qiao

Research output: Contribution to journalArticlepeer-review

13 Scopus citations

Abstract

The mechanical properties and failure mechanisms of the β-Si 3N4 thin layers in basal plane under uniaxial tension are investigated by using molecular dynamics simulations. It is found that the thin layers display a nonlinear stress-strain relationship first at ε < 0.06, and then a linear response at 0.06 < ε < 0.09, and finally the stresses increase nonlinearly with the strains until fracture occurs. The fracture stresses and strains increase with increasing the side lengths of the thin layers, and the trend is same for Young's moduli accompanying little anisotropy. The deterioration in mechanical properties derives from the N 6h-Si bonds where the fracture is initiated.

Original languageEnglish
Article number031907
JournalApplied Physics Letters
Volume102
Issue number3
DOIs
StatePublished - 21 Jan 2013

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