Abstract
4H Silicon carbide (4H-SiC) is one of the most promising materials for pressure sensing in harsh environments. Due to the low efficiency and high energy consumption of dry etching process, mass manufacturing of SiC pressure sensors has always been a challenging problem. A Yb:KGW femtosecond laser was used to perform the circular diaphragms of bulk 4H-SiC by parallel straight line scanning. Small dimension errors and low surface roughness in rapid etching process were measured. This indicates the potential of utilising the femtosecond laser scanning approach to mass-fabricate bulk SiC sensor chips for pressure sensing.
| Original language | English |
|---|---|
| Title of host publication | Proceedings of the 16th Annual IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2021 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 1478-1481 |
| Number of pages | 4 |
| ISBN (Electronic) | 9781665419413 |
| DOIs | |
| State | Published - 25 Apr 2021 |
| Event | 16th Annual IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2021 - Xiamen, China Duration: 25 Apr 2021 → 29 Apr 2021 |
Publication series
| Name | Proceedings of the 16th Annual IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2021 |
|---|
Conference
| Conference | 16th Annual IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2021 |
|---|---|
| Country/Territory | China |
| City | Xiamen |
| Period | 25/04/21 → 29/04/21 |
UN SDGs
This output contributes to the following UN Sustainable Development Goals (SDGs)
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SDG 7 Affordable and Clean Energy
Keywords
- 4H-SiC
- femtosecond laser
- mass fabrication
- pressure sensor
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