ISPT-Net: A Noval Transient Backward-Stepping Reduction Policy by Irregular Sequential Prediction Transformer

  • Yichao Dong
  • , Dan Niu
  • , Zhou Jin
  • , Chuan Zhang
  • , Changyin Sun
  • , Zhenya Zhou

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

In the post-layout simulation for large-scale integrated circuits, transient analysis (TA), determining the time-domain response over a specified time interval, is essential and important. However, it tends to be computationally intensive and quite time-consuming without proper settings of NR initial solution and accurate LTE estimation for determining the next transient timestep, which will lead to a mass of backward-steppings. In this paper, an irregular sequential prediction transformer named ISPT-Net is proposed to predict accurately transient solution as NR initial solution and further obtain precise LTE estimation for setting next timestep. The ISPT-Net is strengthened with timestep positional encoding module (TPE), frequency- and timestep-sensitive muti-head self-attention module (FT-MSA) to enhance irregular sequence feature extraction and prediction accuracy. We assess ISPT-Net in the real large-scale industrial circuits on a commercial SPICE simulator, and achieve a remarkable backward stepping reduction: up to 14.43X for NR nonconvergence case and 4.46X for LTE overlimit case while guaranteeing higher solution accuracy.

Original languageEnglish
Title of host publication2024 Design, Automation and Test in Europe Conference and Exhibition, DATE 2024 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350348590
StatePublished - 2024
Externally publishedYes
Event2024 Design, Automation and Test in Europe Conference and Exhibition, DATE 2024 - Valencia, Spain
Duration: 25 Mar 202427 Mar 2024

Publication series

NameProceedings -Design, Automation and Test in Europe, DATE
ISSN (Print)1530-1591

Conference

Conference2024 Design, Automation and Test in Europe Conference and Exhibition, DATE 2024
Country/TerritorySpain
CityValencia
Period25/03/2427/03/24

Keywords

  • Circuit simulation
  • deep learning
  • irregular sequential prediction
  • transient analysis

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