Interface structures and strain relaxation mechanisms of ferroelectric BaTiO3/SrTiO3 multilayers on (001) MgO substrates

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Abstract

Interface structures and strain relaxation mechanisms of ferroelectric BaTiO3/SrTiO3 multilayers on (001) MgO substrates were systematically studied by electron microscopy. The multilayers are formed in bi-layered structures with different growth morphologies. (i) The lower layer with single crystallinity is an epitaxial layer on the MgO substrate. Defects such as misfit dislocations, anti-phase boundaries, and stacking faults reveal in this layer, acting as a strain relaxation mechanism and (ii) the upper layer is the rest of the multilayer, exhibiting a highly textured columnar structure with small angle boundaries. The columnar grains are formed by local epitaxial growth within individual grains. The strain-relaxation mechanisms are established to understand the growth dynamics of the multilayers.

Original languageEnglish
Pages (from-to)19-24
Number of pages6
JournalJournal of Crystal Growth
Volume383
DOIs
StatePublished - 2013
Externally publishedYes

Keywords

  • A1. Characterization
  • A1. Defects
  • A1. Growth models
  • A3. Pulsed laser deposition
  • B1. Perovskites
  • B2. Ferroelectric materials

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