Abstract
Interface structures and strain relaxation mechanisms of ferroelectric BaTiO3/SrTiO3 multilayers on (001) MgO substrates were systematically studied by electron microscopy. The multilayers are formed in bi-layered structures with different growth morphologies. (i) The lower layer with single crystallinity is an epitaxial layer on the MgO substrate. Defects such as misfit dislocations, anti-phase boundaries, and stacking faults reveal in this layer, acting as a strain relaxation mechanism and (ii) the upper layer is the rest of the multilayer, exhibiting a highly textured columnar structure with small angle boundaries. The columnar grains are formed by local epitaxial growth within individual grains. The strain-relaxation mechanisms are established to understand the growth dynamics of the multilayers.
| Original language | English |
|---|---|
| Pages (from-to) | 19-24 |
| Number of pages | 6 |
| Journal | Journal of Crystal Growth |
| Volume | 383 |
| DOIs | |
| State | Published - 2013 |
| Externally published | Yes |
Keywords
- A1. Characterization
- A1. Defects
- A1. Growth models
- A3. Pulsed laser deposition
- B1. Perovskites
- B2. Ferroelectric materials