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Interface structure of Nb films on single crystal MgO(1 0 0) and MgO(1 1 1) substrates

  • E. G. Fu
  • , Y. Fang
  • , M. J. Zhuo
  • , S. J. Zheng
  • , Z. X. Bi
  • , Y. Q. Wang
  • , M. Tang
  • , X. Ding
  • , W. Z. Han
  • , H. M. Luo
  • , J. K. Baldwin
  • , A. Misra
  • , M. Nastasi
  • Peking University
  • Los Alamos National Laboratory Materials Science and Technology Division
  • Xi'an Jiaotong University
  • Computational Earth Science, Earth and Environmental Sciences Division, Los Alamos National Laboratory
  • New Mexico State University College of Engineering
  • University of Nebraska-Lincoln

Research output: Contribution to journalArticlepeer-review

23 Scopus citations

Abstract

This study systematically investigates the interface structure of Nb films grown on MgO substrates with different orientations ((1 0 0) and (1 1 1)) by experiments and simulations. X-ray diffraction, transmission electron microscopy (TEM) and high-resolution TEM (HRTEM) were used to characterize the structure of Nb films and the structure of interfaces between Nb films and MgO substrates. The results show that thin films exhibit different preferred planes on different orientations of MgO substrates. First-principles calculations were used to understand the interface configuration through a coherent interface model. The combination of experiments and simulations shows that the work of separation, together with substrate orientation and lattice mismatch, determines the interface structure between films and substrates.

Original languageEnglish
Pages (from-to)100-112
Number of pages13
JournalActa Materialia
Volume64
DOIs
StatePublished - Feb 2014

Keywords

  • First principles
  • Interface structure
  • Lattice mismatch
  • TEM and HRTEM
  • Work of separation

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