Interface and Doping Engineering of HfO Based Multi-Level RRAM: Towards Synaptic Simulation for Neuromorphic Computation

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

An ability to simulate synaptic behavior by interface and doping engineering has been reported. A significant improvement in on/off ratio can be obtained by ozone oxidation pre-treatment on a RRAM device. The improved resistive switching behavior with high memory windows can be obtained by Al3+ doping and post deposition annealing helps the device to better show synaptic characteristics.

Original languageEnglish
Title of host publication17th IEEE International Conference on IC Design and Technology, ICICDT 2019 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728118536
DOIs
StatePublished - Jun 2019
Event17th IEEE International Conference on IC Design and Technology, ICICDT 2019 - Suzhou, China
Duration: 17 Jun 201919 Jun 2019

Publication series

Name17th IEEE International Conference on IC Design and Technology, ICICDT 2019 - Proceedings

Conference

Conference17th IEEE International Conference on IC Design and Technology, ICICDT 2019
Country/TerritoryChina
CitySuzhou
Period17/06/1919/06/19

Keywords

  • HfO
  • RRAM
  • doping
  • interface
  • synaptic simulation

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