Intelligent Machinery Fault Diagnosis With Event-Based Camera

  • Xiang Li
  • , Shupeng Yu
  • , Yaguo Lei
  • , Naipeng Li
  • , Bin Yang

Research output: Contribution to journalArticlepeer-review

120 Scopus citations

Abstract

Event-based cameras are the emerging bioinspired technology in vision sensing. Different from the traditional standard cameras, the event-based cameras asynchronously record the brightness change per pixel, and have the great merits of high temporal resolution, low energy consumption, high dynamic range, etc. While the event-based cameras have been initially exploited in several common vision-based tasks in the recent years, the investigation on machine condition monitoring problem is quite limited. This article offers the first attempt in the current literature on exploring the contactless event vision data for machine fault diagnosis. A vibration event representation is proposed to transform the event records into typical data samples, and a deep convolutional neural network model is used for processing the event information. To enhance the model robustness against environmental noisy vision events, an event data augmentation method is proposed to introduce variations of the event patterns. A deep representation clustering method is further proposed to improve the pattern recognition performance with respect to different machine health conditions. Experiments on the event vision-based rotating machine fault diagnosis problem are carried out. It is extensively validated that high fault diagnosis accuracies can be obtained using the vision data from the event-based cameras, which are competitive with the popular accelerometer data. Considering the properties of flexibility, portability, and data recognizability, the event-based cameras thus provide a promising new tool for contactless machine health condition monitoring and fault diagnosis.

Original languageEnglish
Pages (from-to)380-389
Number of pages10
JournalIEEE Transactions on Industrial Informatics
Volume20
Issue number1
DOIs
StatePublished - 1 Jan 2024

Keywords

  • Condition monitoring
  • deep learning
  • event-based camera
  • fault diagnosis
  • machine vision

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