@inproceedings{5cd5ead6bde045de9d4cdb10ef283256,
title = "Influence of the Insulation Layer at the Electrode by Microarc Oxidation on the Surface Discharge",
abstract = "Surface discharge at the triple junction (TJ) is a serious threat to the insulation reliability of high-voltage electrical equipment. Direct contact between the metal electrode, the dielectric, and gas at the TJ is avoided by modifying the metal surface with microarc oxidation (MAO). In this paper, the effect of insulation layers on metal surfaces on the surface discharge process at the TJ and the effect of different microarc voltages on the suppression of the surface discharge are investigated. The results demonstrate that the insulation layer significantly increases the surface discharge inception voltage, with enhancement proportional to the microarc voltage and a maximum improvement of 32.4 \%. Furthermore, the insulation layer not only reduces both the average discharge magnitude and spatial expansion under high voltage but also proposes a novel approach to suppress TJ surface discharges.",
keywords = "MAO, metal surface modification, surface discharge, triple junction",
author = "Zhenyu Wu and Zepeng Lv and Jianhong Song and Xianghuan Zeng and Kai Wu and Yonghong Cheng",
note = "Publisher Copyright: {\textcopyright} 2025 IEEE.; 100th IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2025 ; Conference date: 14-09-2025 Through 17-09-2025",
year = "2025",
doi = "10.1109/CEIDP61707.2025.11218405",
language = "英语",
series = "Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "44--47",
booktitle = "2025 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2025",
}