Incident ion charge state dependence of the visible light emission of Xeq+ ions bombarding aluminum

  • Y. Guo
  • , Z. Yang
  • , Q. Xu
  • , J. Ren
  • , H. Zhao
  • , Y. Zhao

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

In this work, we studied the photon emission in the visible light range for Xeq+ ions of different charge states (10 ≤ q ≤ 21) bombardment on an aluminum target at 410 keV. During the interactions, the spectra in wavelength range 300-500 nm are recorded, including the photons from Al atoms and neutralized Xe+ ions. The yield of the visible light strongly depends on the projectile charge states. Its variation tendency with the charge states is similar to that of the potential energy variation. In addition, the experimental results also indicate that when the incident charge state is less than the critical charge state, it obeys the staircase classical-over-barrier model.

Original languageEnglish
Pages (from-to)663-668
Number of pages6
JournalLaser and Particle Beams
Volume34
Issue number4
DOIs
StatePublished - 1 Dec 2016

Keywords

  • Keywords Highly charged ion
  • Neutralization
  • Potential energy
  • Visible light

Fingerprint

Dive into the research topics of 'Incident ion charge state dependence of the visible light emission of Xeq+ ions bombarding aluminum'. Together they form a unique fingerprint.

Cite this