@inproceedings{7f268e602cda4a329b801f9095458026,
title = "In Situ Observation of Nanoprotrusion Growth on a Carbon Coated Tungsten Nanotip under Field",
abstract = "Nano-protrusions (NPs) on metal surfaces and their contamination layers can be precursors of vacuum breakdown, detrimental to many devices. We run Field Emission (FE) experiments in-situ a Transmission Electron Microscope (TEM) on an amorphous-carbon (a-C) coated tungsten (W) nanotip. In various cases we observe the FE current-voltage (I-V) curves switching abruptly into an increased current state. Accompanying FE simulations show that the enhanced-current I-Vs are consistent with the growth of an NP at the tip apex. The tip growth hypothesis is confirmed by the direct observation of such an NP and its continued growth during successive FE experiments. We attribute this phenomenon to field-induced biased diffusion of atoms on the surface of the a-C coating.",
keywords = "biased diffusion, carbon contamination, diffusion under field, protrusion growth",
author = "Guodong Meng and L. Yimeng and Koitermaa, \{Roni Aleksi\} and Veronika Zadin and Yonghong Cheng and Andreas Kyritsakis",
note = "Publisher Copyright: {\textcopyright} 2024 IEEE.; 37th International Vacuum Nanoelectronics Conference, IVNC 2024 ; Conference date: 15-07-2024 Through 19-07-2024",
year = "2024",
doi = "10.1109/IVNC63480.2024.10652425",
language = "英语",
series = "2024 37th International Vacuum Nanoelectronics Conference, IVNC 2024",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2024 37th International Vacuum Nanoelectronics Conference, IVNC 2024",
}