Abstract
To achieve higher accuracy in planar near-field measurement, an improved approach based on complex convolutional neural networks is proposed, along with a dataset generation method for model training in this work. This improved method can calculate the spherical wave coefficients from the planar sampling data and then calculate the far-field pattern of the antenna under test. By employing a reasonable model structure and training design, the improved approach attains higher accuracy than conventional method on practical data, offering a new approach to enhance the planar near-field measurement.
| Original language | English |
|---|---|
| Journal | Proceedings of the IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications, IMWS-AMP |
| Issue number | 2024 |
| DOIs | |
| State | Published - 2024 |
| Event | 2024 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications, IMWS-AMP 2024 - Nanjing, China Duration: 8 Nov 2024 → 11 Nov 2024 |
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