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Highly (4 0 0) preferential ITO thin film prepared by DC sputtering with excellent conductivity and infrared reflectivity

  • L. Dong
  • , Y. D. Chen
  • , G. S. Zhu
  • , H. R. Xu
  • , J. J. Song
  • , X. Y. Zhang
  • , Y. Y. Zhao
  • , D. L. Yan
  • , Y. L
  • , A. B. Yu
  • Guilin University of Electronic Technology
  • Xihua University

Research output: Contribution to journalArticlepeer-review

30 Scopus citations

Abstract

ITO (Indium Tin Oxide) thin film with a sandwich structure that comprises two layers of oxygen-poor layer and an oxygen-rich layer was deposited on glass substrates by DC sputtering using a ceramic target. The effect of structure on the photoelectric properties of the ITO thin film was investigated. The results indicated that the as-prepared ITO film with sandwich structure showed high (4 0 0) preferred orientation. Simultaneously, the ITO thin film with sandwich structure exhibited excellent optoelectronic properties, which has a low resistivity of 1.384 × 10−4 Ωcm, high visible light transmittance of 88.34% and a high IR reflectivity of 88.37%. Excellent optoelectronic properties can meet the infrared stealth requirements for aircraft windows.

Original languageEnglish
Article number126735
JournalMaterials Letters
Volume260
DOIs
StatePublished - 1 Feb 2020

Keywords

  • (4 0 0) preferential orientation
  • IR reflectivity
  • Photoelectric properties
  • Sputtering
  • Thin films

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