Higher order asymptotic solutions of V-notch tip fields for damaged nonlinear materials under antiplane shear loading

The higher order solutions of stress and deformation fields near the tip of a sharp V-notch in a power-law hardening material with continuous damage formation are analytically investigated under antiplane shear loading condition. The interaction between a macroscopic sharp notch and distributed microscopic damage is considered by describing the effect of damage in terms of a damage variable in the framework of damage mechanics. A deformation plasticity theory coupled with damage and a damage evolution law are formulated. A hodograph transformation is employed to determine the solution of damaged nonlinear notch problem in the stress plane. Then, inversion of the stress plane solution to the physical plane is performed. Consequently, higher order terms in the asymptotic solutions of the notch tip fields are obtained. Analytical expressions of the dominant and second order singularity exponents and associated angular distribution functions of notch tip stress and strain are presented. Effects of damage and strain hardening exponents and notch angle on the singular behavior of the notch tip quantities are discussed detailly. It is found that damage can lead to a weaker singularity of the dominant term of stress on one hand, but to stronger singularities of the second order term of stress and the dominant and second order terms of strain compared to that for undamaged case on the other. Also, both hardening exponent and notch angle have important effects on the notch tip quantities. Moreover, reduction of the notch tip solutions to a damaged nonlinear crack problem is carried out, and higher order solutions of the crack tip fields are obtained. Effects of damage and hardening exponents on the dominant and second order terms in the crack tip solutions are detailly discussed. Discussions on some other special cases are also presented, which shows that if damage exponent equals to zero, then the present solutions can be easily reduced to the solutions for undamaged cases.