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Helium Ion Microscope Fabrication Causing Changes in the Structure and Mechanical Behavior of Silicon Micropillars

  • Xi'an Jiaotong University
  • Nanjing University of Science and Technology
  • Johns Hopkins University

Research output: Contribution to journalArticlepeer-review

12 Scopus citations
Original languageEnglish
Article number1601753
JournalSmall
Volume13
Issue number1
DOIs
StatePublished - Jan 2017

Keywords

  • helium ion microscopes
  • helium ions dosage
  • mechanical behaviors
  • silicon micropillars

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