Hardness determination of Au thin film by nanoindentation technique - A comparative study on various characterizing methods

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Abstract

The purpose of this paper is to find a reliable method for determining the hardnesses of son metallic thin films on hard substrates. Based on the nanoindention experimental data for a 504 nm Au thin film deposited on glass substrate system, several possible methods are applied and the results come from them are compared. The results reveal that the Oliver-Pharr method is strongly influenced by the material pile-up behavior and substrate effect that leads to an erroneously overestimated hardness. However, the methods based on traditional area calculations by SEM image, work of indentation principles during the indentation cycle and constant modulus assumption calculations all can effectively avoid the effect of pile-up and minimize that of substrate. Among three, the results from indentation method are obviously much higher than those from other two. Hence we argue that the results by SEM image method and constant modulus assumption calculations are more reasonable.

Original languageEnglish
Title of host publicationProceedings of the International Conference on Integration and Commercialization of Micro and Nanosystems 2007
Pages621-627
Number of pages7
DOIs
StatePublished - 2007
EventInternational Conference on Integration and Commercialization of Micro and Nanosystems 2007 - Sanya, Hainan, China
Duration: 10 Jan 200713 Jan 2007

Publication series

NameProceedings of the International Conference on Integration and Commercialization of Micro and Nanosystems 2007
VolumeA

Conference

ConferenceInternational Conference on Integration and Commercialization of Micro and Nanosystems 2007
Country/TerritoryChina
CitySanya, Hainan
Period10/01/0713/01/07

Keywords

  • Au
  • Hardness
  • Mechanical properties
  • Nanoindentation
  • Thin metallic film

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