Growth of the relaxor based ferroelectric single crystals Pb(In 1/2Nb1/2)O3-Pb(Mg1/3Nb 2/3)O3-PbTiO3 by vertical Bridgman technique

  • Xian Wang
  • , Zhuo Xu
  • , Zhenrong Li
  • , Fei Li
  • , Hongbing Chen
  • , Shiji Fan

Research output: Contribution to journalConference articlepeer-review

31 Scopus citations

Abstract

The relaxor-based ferroelectric single crystals Pb(In1/2Nb 1/2)O3- Pb(Mg1/3 Nb2/3)O 3-PbTiO3 were grown successfully using the vertical Bridgman technique. The crystals were spontaneously nucleated and induced to grow by the seed respectively, with diameter of Φ25-40 mm and length of 80-170 mm. The [001]-oriented wafers of as-grown crystals showed the excellent electrical characterizations (ε∼5500, tanδ∼1.35%, d 33 ∼1900pC/N, k33∼0.9). Both the higher rhombohedral-tetragonal phase transition temperature (Tr/t ∼100-120°C) and Curie temperature (Tc ∼170-200°C) enlarged the operating temperature range of the devices. The crystals had the stable time dependence of piezoelectric properties. Therefore, the successful growth and high performance made the crystal be a promising candidate for the ultrasonic applications.

Original languageEnglish
Pages (from-to)173-180
Number of pages8
JournalFerroelectrics
Volume401
Issue number1
DOIs
StatePublished - 2010
Event12th International Meeting on Ferroelectricity, IMF-12 and the 18th IEEE International Symposium on Applications of Ferroelectrics, ISAF-18 - Xi'an, China
Duration: 23 Aug 200927 Aug 2009

Keywords

  • Bridgman technique
  • Crystal growth
  • Electrical characterization
  • Single crystal
  • Ultrasonic application

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