TY - GEN
T1 - Graph Few-shot Learning with Attribute Matching
AU - Wang, Ning
AU - Luo, Minnan
AU - Ding, Kaize
AU - Zhang, Lingling
AU - Li, Jundong
AU - Zheng, Qinghua
N1 - Publisher Copyright:
© 2020 ACM.
PY - 2020/10/19
Y1 - 2020/10/19
N2 - Due to the expensive cost of data annotation, few-shot learning has attracted increasing research interests in recent years. Various meta-learning approaches have been proposed to tackle this problem and have become the de facto practice. However, most of the existing approaches along this line mainly focus on image and text data in the Euclidean domain. However, in many real-world scenarios, a vast amount of data can be represented as attributed networks defined in the non-Euclidean domain, and the few-shot learning studies in such structured data have largely remained nascent. Although some recent studies have tried to combine meta-learning with graph neural networks to enable few-shot learning on attributed networks, they fail to account for the unique properties of attributed networks when creating diverse tasks in the meta-training phase - -The feature distributions of different tasks could be quite different as instances (i.e., nodes) do not follow the data i.i.d. assumption on attributed networks. Hence, it may inevitably result in suboptimal performance in the meta-testing phase. To tackle the aforementioned problem, we propose a novel graph meta-learning framework - Attribute Matching Meta-learning Graph Neural Networks (AMM-GNN). Specifically, the proposed AMM-GNN leverages an attribute-level attention mechanism to capture the distinct information of each task and thus learns more effective transferable knowledge for meta-learning. We conduct extensive experiments on real-world datasets under a wide range of settings and the experimental results demonstrate the effectiveness of the proposed AMM-GNN framework.
AB - Due to the expensive cost of data annotation, few-shot learning has attracted increasing research interests in recent years. Various meta-learning approaches have been proposed to tackle this problem and have become the de facto practice. However, most of the existing approaches along this line mainly focus on image and text data in the Euclidean domain. However, in many real-world scenarios, a vast amount of data can be represented as attributed networks defined in the non-Euclidean domain, and the few-shot learning studies in such structured data have largely remained nascent. Although some recent studies have tried to combine meta-learning with graph neural networks to enable few-shot learning on attributed networks, they fail to account for the unique properties of attributed networks when creating diverse tasks in the meta-training phase - -The feature distributions of different tasks could be quite different as instances (i.e., nodes) do not follow the data i.i.d. assumption on attributed networks. Hence, it may inevitably result in suboptimal performance in the meta-testing phase. To tackle the aforementioned problem, we propose a novel graph meta-learning framework - Attribute Matching Meta-learning Graph Neural Networks (AMM-GNN). Specifically, the proposed AMM-GNN leverages an attribute-level attention mechanism to capture the distinct information of each task and thus learns more effective transferable knowledge for meta-learning. We conduct extensive experiments on real-world datasets under a wide range of settings and the experimental results demonstrate the effectiveness of the proposed AMM-GNN framework.
KW - few-shot learning
KW - graph neural networks
KW - node classification
UR - https://www.scopus.com/pages/publications/85095865468
U2 - 10.1145/3340531.3411923
DO - 10.1145/3340531.3411923
M3 - 会议稿件
AN - SCOPUS:85095865468
T3 - International Conference on Information and Knowledge Management, Proceedings
SP - 1545
EP - 1554
BT - CIKM 2020 - Proceedings of the 29th ACM International Conference on Information and Knowledge Management
PB - Association for Computing Machinery
T2 - 29th ACM International Conference on Information and Knowledge Management, CIKM 2020
Y2 - 19 October 2020 through 23 October 2020
ER -