TY - GEN
T1 - Gesture Recognition
T2 - 2024 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2024
AU - Wang, Sen
AU - Li, Borun
AU - Zhang, Tingting
AU - Wang, Jian
AU - Zhao, Zhibing
AU - Zhang, De Wen
N1 - Publisher Copyright:
© 2024 IEEE.
PY - 2024
Y1 - 2024
N2 - This study introduces an EIT -based gesture recognition system focusing on the entire arm, including hand movements. Utilizing a 16-electrode system and the Gauss-Newton method, we conducted experiments with six participants, testing various gestures at frequencies of 1 kHz, 10 kHz, and 100 kHz. The introduced Similarity Evaluation Index (SEI) identified 10 kHz as a potentially optimal testing frequency, exhibiting an 11 % difference in relative conductivity. Repeated measurements demonstrated system stability, while individual variations underscored the complexity influenced by behavioral habits and physiology. Future endeavors aim to refine sensitivity, expand the gesture repertoire, and explore practical applications, positioning this work at the forefront of human-technology interaction research.
AB - This study introduces an EIT -based gesture recognition system focusing on the entire arm, including hand movements. Utilizing a 16-electrode system and the Gauss-Newton method, we conducted experiments with six participants, testing various gestures at frequencies of 1 kHz, 10 kHz, and 100 kHz. The introduced Similarity Evaluation Index (SEI) identified 10 kHz as a potentially optimal testing frequency, exhibiting an 11 % difference in relative conductivity. Repeated measurements demonstrated system stability, while individual variations underscored the complexity influenced by behavioral habits and physiology. Future endeavors aim to refine sensitivity, expand the gesture repertoire, and explore practical applications, positioning this work at the forefront of human-technology interaction research.
KW - Comprehensive Arm Movements
KW - Electrical Impedance Tomography
KW - Gesture Recognition
KW - Real-time Monitoring
UR - https://www.scopus.com/pages/publications/85197816916
U2 - 10.1109/I2MTC60896.2024.10560962
DO - 10.1109/I2MTC60896.2024.10560962
M3 - 会议稿件
AN - SCOPUS:85197816916
T3 - Conference Record - IEEE Instrumentation and Measurement Technology Conference
BT - I2MTC 2024 - Instrumentation and Measurement Technology Conference
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 20 May 2024 through 23 May 2024
ER -