Flash X-ray Diffraction Measurement of LiF Crystal Deformation Under Shock Loading

A pulse X-ray diffraction measurement system is established by using a miniaturized flash X-ray source on gas gun loading experimental platform. The system is used to study the microstructure change of LiF crystal lattice under plate shock loading experiments. Single pulse X-ray diffraction images from LiF crystals are obtained under different shock loading pressures. Experimental results show that crystal lattice of LiF is compressed when LiF crystal is loaded along [100] orientation, and the amount of compression is related to the shift of diffraction peak position. Quantitative measurement of material microstructure change under shock compression can be achieved by pulse X-ray diffraction measurement system using miniaturized flash X-ray source. The system described here has advantages such as small size and easy to use, and it provides effective method to study the microscopic mechanism of elastic-plastic deformation.