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Fine-Grained Repair Knowledge Organization for Knowledge-Guided Automated Program Repair

  • China Research Institute of Radiowave Propagation
  • Xi'an Jiaotong University
  • State-Owned Factory No. 5137

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Template-based automated program repair (APR) exposes explicit repair knowledge, but existing template inventories are often too coarse to act as reusable knowledge units. We therefore study fine-grained repair knowledge organization, which starts from coarse template families, builds multi-view representations of historical bug-fix pairs, discovers finer repair groups, and abstracts them into structured knowledge entries. The resulting knowledge base supports retrieval, classifier-based selection, and retrieval-to-classifier reranking, and is grounded in localization-enhanced prompts for patch generation. On an internal Recoder workflow, the approach constructs a non-trivial inventory of 184 accepted fine-grained templates and improves repair over bug-only conditioning. On Defects4J, retrieval is stronger in the top-1 regime, while larger candidate budgets favor classifier or rerank selection. On the full Defects4J 1.2 benchmark, knowledge-guided repair substantially outperforms the template-free bug-only baseline, and the same trend remains visible across both Qwen and Llama.

Original languageEnglish
Title of host publicationAdvanced Intelligent Computing Technology and Applications - 22nd International Conference on Intelligent Computing, ICIC 2026, Proceedings
EditorsDe-Shuang Huang, Yijie Pan, Chuanlei Zhang, Wei Chen, Prashan Premaratne
PublisherSpringer Science and Business Media Deutschland GmbH
Pages610-622
Number of pages13
ISBN (Print)9789819234493
DOIs
StatePublished - 2027
Event22nd International Conference on Intelligent Computing, ICIC 2026 - Toronto, Canada
Duration: 22 Jul 202626 Jul 2026

Publication series

NameLecture Notes in Computer Science
Volume16667 LNCS
ISSN (Print)0302-9743
ISSN (Electronic)1611-3349

Conference

Conference22nd International Conference on Intelligent Computing, ICIC 2026
Country/TerritoryCanada
CityToronto
Period22/07/2626/07/26

Keywords

  • Automated Program Repair
  • Defects4J
  • Large Language Models
  • Repair Knowledge Organization
  • Template-Based Repair

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