Abstract
Lead-free ferroelectric (K0.44 Na0.52Li 0.04)(Nb0.86Ta 0.10Sb0.04)O 3 (KNN-LT-LS) thin films have been prepared by a pulsed laser deposition process on Pt/Ti/SiO2/Si substrates. Morphologies, structures and electrical properties of KNN-LT-LS thin films have been investigated as a function of deposition temperature from 680°C to 740°C. X-ray diffraction analysis indicates that KNN-LT-LS thin films are a perovskite phase with a preferential (001) orientation. The dielectric constant and loss tangent of KNN-LT-LS films deposited at 740°C are 1450 and 7.2% at 1 kHz, respectively. The P-E hysteresis loops show that the KNN-LT-LS thin films possess improved ferroelectric properties. The remnant polarization and the coercive field of the films are 7.69 μC/cm2 and 40.8 kV/cm, respectively.
| Original language | English |
|---|---|
| Pages (from-to) | 62-67 |
| Number of pages | 6 |
| Journal | Ferroelectrics |
| Volume | 406 |
| Issue number | 1 |
| DOIs | |
| State | Published - 2010 |
| Event | 12th International Meeting on Ferroelectricity, IMF-12 and the 18th IEEE International Symposium on Applications of Ferroelectrics, ISAF-18 - Xi'an, China Duration: 23 Aug 2009 → 27 Aug 2009 |
Keywords
- Dielectric and ferroelectric properties
- Lead-free potassium sodium niobate
- Pulsed laser deposition
- Thin films
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