Ferroelectric (K0.44Na0.52 Li0.04)(Nb 0.86Ta0.10Sb0.04)O3 thin films prepared by pulsed laser deposition

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Abstract

Lead-free ferroelectric (K0.44 Na0.52Li 0.04)(Nb0.86Ta 0.10Sb0.04)O 3 (KNN-LT-LS) thin films have been prepared by a pulsed laser deposition process on Pt/Ti/SiO2/Si substrates. Morphologies, structures and electrical properties of KNN-LT-LS thin films have been investigated as a function of deposition temperature from 680°C to 740°C. X-ray diffraction analysis indicates that KNN-LT-LS thin films are a perovskite phase with a preferential (001) orientation. The dielectric constant and loss tangent of KNN-LT-LS films deposited at 740°C are 1450 and 7.2% at 1 kHz, respectively. The P-E hysteresis loops show that the KNN-LT-LS thin films possess improved ferroelectric properties. The remnant polarization and the coercive field of the films are 7.69 μC/cm2 and 40.8 kV/cm, respectively.

Original languageEnglish
Pages (from-to)62-67
Number of pages6
JournalFerroelectrics
Volume406
Issue number1
DOIs
StatePublished - 2010
Event12th International Meeting on Ferroelectricity, IMF-12 and the 18th IEEE International Symposium on Applications of Ferroelectrics, ISAF-18 - Xi'an, China
Duration: 23 Aug 200927 Aug 2009

Keywords

  • Dielectric and ferroelectric properties
  • Lead-free potassium sodium niobate
  • Pulsed laser deposition
  • Thin films

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