FEM thermal analysis of Cu/diamond/Cu and diamond/SiC heat spreaders

  • Garuma Abdisa Denu
  • , Jibran Hussain Mirani
  • , Jiao Fu
  • , Zongchen Liu
  • , Hongxing Wang

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Abstract

The effects of thermal stress resulting from thermal cooling in copper/diamond/copper heat spreader is investigated using finite element method. A similar model of diamond/SiC heat spreader is compared without addition of interlayer. The effect of carbide interlayer in reduction of interfacial thermal stress is investigated. The results show that the carbide interlayer film thickness is critical in stress reduction for a copper/diamond/copper heat spreader device. Diamond/SiC device has lower interfacial stress without interlayer. The study of mechanical and thermal property of diamond heat spreader is useful for optimal designs of efficient heat spreader for electronic components.

Original languageEnglish
Article number035102
JournalAIP Advances
Volume7
Issue number3
DOIs
StatePublished - 1 Mar 2017

Fingerprint

Dive into the research topics of 'FEM thermal analysis of Cu/diamond/Cu and diamond/SiC heat spreaders'. Together they form a unique fingerprint.

Cite this