Fabrication of condenser microphones on silicon on insulator wafer

  • Shinsuke Hishinuma
  • , Naoki Kimori
  • , Yuichiro Kumai
  • , Kouki Oku
  • , Tetsuya Takahashi
  • , Daiki Irokawa
  • , Emiko Sugizaki
  • , Naoki Watanabe
  • , Tsuyoshi Ikehara
  • , Ryutaro Maeda
  • , Yasushiro Nishioka

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

A silicon condenser microphone on an SOI (silicon on insulator) substrate using only one photo mask was fabricated. This microphone consists of a diaphragm with the thickness of 20 μm and the diameter of 2 mm, a SiO 2 insulative spacer (4-μm-thick buried oxide), and a 450-μm-thick silicon back plate with the meshed structures having extremely small (60 μm) hexagonal shaped acoustic holes. The gap between the 20-μm-thick silicon diaphragm and the back plate is 4 μm, which is determined by the thickness of the buried oxide in the SOI wafer. This microphone was confirmed to function as a static pressure sensor. The SOI microphone was also connected to an amplifier circuit, and exposed to the sound pressure of 110 dB at the frequency of 1 kHz. The microphone clearly responded to the input sound, and the output ac voltage of approximately 40 μV was detected.

Original languageEnglish
Title of host publicationEmerging Focus on Advanced Materials
Pages193-200
Number of pages8
DOIs
StatePublished - 2011
Externally publishedYes
Event1st International Congress on Advanced Materials 2011, AM2011 - Jinan, China
Duration: 13 May 201116 May 2011

Publication series

NameAdvanced Materials Research
Volume306-307
ISSN (Print)1022-6680

Conference

Conference1st International Congress on Advanced Materials 2011, AM2011
Country/TerritoryChina
CityJinan
Period13/05/1116/05/11

Keywords

  • Condenser
  • MEMS
  • Microphone
  • Silicon

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