TY - GEN
T1 - Exponential C-Loss for data fitting
AU - Chen, Badong
AU - Wang, Ren
AU - Zheng, Nanning
AU - Principe, Jose C.
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/9/28
Y1 - 2015/9/28
N2 - As a robust measure of similarity, C-Loss can be successfully used for data fitting such as regression and classification, especially when data contain large outliers. In this paper, we propose a modified C-Loss function, called exponential C-Loss (EC-Loss), which is defined as an exponential function of the C-Loss. The EC-Loss inherits the robustness and smoothness of the C-Loss but may have a better performance surface that favors the usage of a gradient-based learning algorithm, particularly at a region far from the optimal solution. In order to avoid the flatness of the performance surface near the optimal solution and obtain a fast convergence speed during the overall adaptation process, we also propose a novel switching strategy between C-Loss and EC-Loss. A simple simulation example is presented to demonstrate the performance surface and desirable performance of the new method.
AB - As a robust measure of similarity, C-Loss can be successfully used for data fitting such as regression and classification, especially when data contain large outliers. In this paper, we propose a modified C-Loss function, called exponential C-Loss (EC-Loss), which is defined as an exponential function of the C-Loss. The EC-Loss inherits the robustness and smoothness of the C-Loss but may have a better performance surface that favors the usage of a gradient-based learning algorithm, particularly at a region far from the optimal solution. In order to avoid the flatness of the performance surface near the optimal solution and obtain a fast convergence speed during the overall adaptation process, we also propose a novel switching strategy between C-Loss and EC-Loss. A simple simulation example is presented to demonstrate the performance surface and desirable performance of the new method.
KW - C-Loss
KW - exponential C-Loss (EC-Loss)
KW - supervised learning
UR - https://www.scopus.com/pages/publications/84951207120
U2 - 10.1109/IJCNN.2015.7280708
DO - 10.1109/IJCNN.2015.7280708
M3 - 会议稿件
AN - SCOPUS:84951207120
T3 - Proceedings of the International Joint Conference on Neural Networks
BT - 2015 International Joint Conference on Neural Networks, IJCNN 2015
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - International Joint Conference on Neural Networks, IJCNN 2015
Y2 - 12 July 2015 through 17 July 2015
ER -