Evolution of dielectric properties of cross-linked polyethylene under thermal-oxidative aging

  • Jingran Wang
  • , Minzun Ji
  • , Hongwei Zhuang
  • , Wei Wei
  • , Xiaohong Chi
  • , Lu Cheng
  • , Wenfeng Liu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

An investigation of thermal-oxidative degradation of cross-linked polyethylene (XLPE) has been carried out in this paper. As the key characteristics, dielectric properties are important for assessing the insulation state of cables. XLPE specimens were thermally aged at 165 °C and removed at regular intervals for analysis. The dielectric properties were investigated through the Frequency Domain Spectroscopy (FDS) and the structural changes were analyzed with the Fourier transform infrared (FT-IR) spectroscopy. And the Haviliak-Negami dielectric model is applied to extract the characteristic parameters. The experiment and fitting results show that the dipolar polarization strength Δϵα, the DC conductivity σdc, the relative permittivity at high frequency ϵ∞, and the thermal expansion coefficient β increase gradually with the aging time. It is found that the quantitative analysis of the frequency domain spectroscopy can be well applied to the state assessment of XLPE cables.

Original languageEnglish
Title of host publication2022 IEEE International Conference on High Voltage Engineering and Applications, ICHVE 2022
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781665407502
DOIs
StatePublished - 2022
Event2022 IEEE International Conference on High Voltage Engineering and Applications, ICHVE 2022 - Chongqing, China
Duration: 25 Sep 202229 Sep 2022

Publication series

Name2022 IEEE International Conference on High Voltage Engineering and Applications, ICHVE 2022

Conference

Conference2022 IEEE International Conference on High Voltage Engineering and Applications, ICHVE 2022
Country/TerritoryChina
CityChongqing
Period25/09/2229/09/22

Keywords

  • dielectric property
  • Haviliak-Negami dielectric model
  • thermal-oxidative ageing
  • XLPE

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