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Erratum: Application of Zr-Si film as diffusion barrier in Cu metallization (Electrochemical and Solid-State Letters (2007) 10 (H299))

  • Harbin Engineering University

Research output: Contribution to journalComment/debate

Original languageEnglish
Pages (from-to)S11
JournalElectrochemical and Solid-State Letters
Volume12
Issue number8
DOIs
StatePublished - 2009

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