TY - GEN
T1 - Equivalent accelerated aging method to evaluate long-term performance of metalized film capacitor for voltage source converter application
AU - Liu, Yongbin
AU - Yao, Ruifeng
AU - Gao, Jinghui
AU - Cao, Junzheng
AU - Qu, Haitao
AU - Jian, Li
AU - Wang, Yan
AU - Zhang, Yikai
AU - Zhang, Shehong
AU - Zhong, Lisheng
N1 - Publisher Copyright:
© 2018 IEEE.
PY - 2018/6/29
Y1 - 2018/6/29
N2 - Metalized film capacitor (MFC) with ultrahigh power is one of the key power devices in High Voltage Direct Current (HVDC) power transmission technology, and the evaluation of its long-term performance (especially its lifetime) is of great importance for reliability of HVDC system. But those experiments require enormous power supply capacity which is difficult to achieve in laboratory. In this paper, we propose a feasible equivalent experiment method to evaluate long-term performance of ultrahigh power MFC, which employs floating aging at elevated temperature and voltage level imitating electric and thermal effect in operating condition. Thermal effect of ripple current has been equalized as temperature rise of 14.7°C according to finite element analysis and temperature rise experiment, and the enhanced strength of electric field caused by the ripple voltage has been equalized as voltage rise of 196V. The equivalent method proposed enables laboratory study on long-term performance of ultrahigh power MFC.
AB - Metalized film capacitor (MFC) with ultrahigh power is one of the key power devices in High Voltage Direct Current (HVDC) power transmission technology, and the evaluation of its long-term performance (especially its lifetime) is of great importance for reliability of HVDC system. But those experiments require enormous power supply capacity which is difficult to achieve in laboratory. In this paper, we propose a feasible equivalent experiment method to evaluate long-term performance of ultrahigh power MFC, which employs floating aging at elevated temperature and voltage level imitating electric and thermal effect in operating condition. Thermal effect of ripple current has been equalized as temperature rise of 14.7°C according to finite element analysis and temperature rise experiment, and the enhanced strength of electric field caused by the ripple voltage has been equalized as voltage rise of 196V. The equivalent method proposed enables laboratory study on long-term performance of ultrahigh power MFC.
UR - https://www.scopus.com/pages/publications/85049838497
U2 - 10.1109/ICPADM.2018.8401224
DO - 10.1109/ICPADM.2018.8401224
M3 - 会议稿件
AN - SCOPUS:85049838497
T3 - Proceedings of the IEEE International Conference on Properties and Applications of Dielectric Materials
SP - 227
EP - 230
BT - ICPADM 2018 - 12th International Conference on the Properties and Applications of Dielectric Materials
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 12th International Conference on the Properties and Applications of Dielectric Materials, ICPADM 2018
Y2 - 20 May 2018 through 24 May 2018
ER -