Abstract
Taking advantage of the relatively low temperature crystallization and high orientation of thin films of Pb0.8La0.1Ca 0.1Ti0.975O3 (PLCT), growth of a highly (100)-oriented PLCT/Pb (Nb0.01Zr0.2Ti0.8)O 3 (PNZT) multilayer film on a Pt/Ti/ SiO2 /Si substrate is achieved at a temperature as low as 450 °C. The interfacial diffusion in the multilayer film is decreased by the low temperature of crystallization. A relatively low dielectric constant and high pyrocoefficient are simultaneously achieved in the highly (100)-oriented PLCT/PNZT multilayer film. The high figure-of-merit obtained for this multilayer film make it a good candidate for application in pyroelectric thin-film devices.
| Original language | English |
|---|---|
| Article number | 242903 |
| Journal | Applied Physics Letters |
| Volume | 98 |
| Issue number | 24 |
| DOIs | |
| State | Published - 13 Jun 2011 |
| Externally published | Yes |
Fingerprint
Dive into the research topics of 'Enhanced performance of Pb0.8La0.1Ca 0.1Ti0.975O3 /Pb (Nb0.01Zr 0.2Ti0.8)O3 multilayer thin films for pyroelectric applications'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver