Abstract
The effect of nanopillar texturing on the performance of InP solar cells is investigated. Maskless, lithography-free reactive ion etching of InP nanopillars improves the open-circuit voltage, reduces reflectance over a broad spectral range, and enhances the near-bandgap response compared to a flat, non-textured cell with comparable reflectance in the infrared. Electron-beam induced current measurements indicate an increased effective minority carrier collection length. The response at short wavelengths decreases due to the formation of a defective surface layer with strong non-radiative recombination. Plasma oxidation and wet etching partially restore the blue response resulting in a power conversion efficiency of 14.4%.
| Original language | English |
|---|---|
| Article number | 1400061 |
| Journal | Advanced Energy Materials |
| Volume | 4 |
| Issue number | 10 |
| DOIs | |
| State | Published - 15 Jul 2014 |
| Externally published | Yes |
Keywords
- InP
- nanopillars
- photovoltaics
- reactive ion etching
- surface recombination