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EMI modeling and experiment of a GaN based LLC half-bridge converter

  • Xi'an Jiaotong University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

12 Scopus citations

Abstract

This paper focuses on the electromagnetic interference (EMI) research and analysis of the MHz switching frequency GaN MOSFET based on the LLC resonant DC-DC converter. In this paper, first, the CM coupling paths are studied to get simplified models. Then the impact of the parasitic capacitors (both the capacitors to the ground and the capacitors in the devices) on the CM current are analyzed. Finally the high frequency model is derived from the work above. Moreover this paper makes the comparison between normal Si MOSFET and GaN-based MOSFET behavior in EMI. The modeling result proves that GaN MOSFET has a worse behavior on EMI test. An experiment layout which is aimed at minimizing the irrelevant factors is designed and the experiment result proves the accuracy of the modeling.

Original languageEnglish
Title of host publication9th International Conference on Power Electronics - ECCE Asia
Subtitle of host publication"Green World with Power Electronics", ICPE 2015-ECCE Asia
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1961-1966
Number of pages6
ISBN (Electronic)9788957082546
DOIs
StatePublished - 27 Jul 2015
Event9th International Conference on Power Electronics - ECCE Asia, ICPE 2015-ECCE Asia - Seoul, Korea, Republic of
Duration: 1 Jun 20155 Jun 2015

Publication series

Name9th International Conference on Power Electronics - ECCE Asia: "Green World with Power Electronics", ICPE 2015-ECCE Asia

Conference

Conference9th International Conference on Power Electronics - ECCE Asia, ICPE 2015-ECCE Asia
Country/TerritoryKorea, Republic of
CitySeoul
Period1/06/155/06/15

Keywords

  • DC-DC converter
  • EMI
  • GaN Mosfet
  • layout

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