Electron emission by highly charged neon and xenon ions on fusion-relevant tungsten and graphite surfaces

Yuyu Wang; Yongtao Zhao; Jianrong Sun; A. Qayyum; Jie Liu; Zhiguang Wang; Guoqing Xiao

doi:10.1016/j.nimb.2010.11.071

Electron emission by highly charged neon and xenon ions on fusion-relevant tungsten and graphite surfaces

Yuyu Wang
, Yongtao Zhao
, Jianrong Sun
, A. Qayyum
, Jie Liu
, Zhiguang Wang
, Guoqing Xiao

CAS - Institute of Modern Physics
Pakistan Atomic Energy Commission

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

Abstract

Here we report highly charged ⁴⁰Ne^q+ (q = 3-8) and ¹²⁹Xe^q+ (q = 10-30) ion-induced secondary electron emission on the tungsten and highly oriented pyrolytic graphite (HOPG) surfaces. The total secondary electron yield is measured as a function of the potential energy of incident ion. The experimental data is used to separate contributions of kinetic and potential electron yields. We estimate roughly 10% of ion's potential energy is consumed in potential electron emission. The rest of the ion's potential energy is responsible for the sputtering and material modification.

Original language	English
Pages (from-to)	977-980
Number of pages	4
Journal	Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume	269
Issue number	9
DOIs	https://doi.org/10.1016/j.nimb.2010.11.071
State	Published - 1 May 2011
Externally published	Yes

Keywords

Electron emission
Highly charged ions

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10.1016/j.nimb.2010.11.071

Cite this

@article{2693baa008db4782965d7b3cf2df7969,

title = "Electron emission by highly charged neon and xenon ions on fusion-relevant tungsten and graphite surfaces",

abstract = "Here we report highly charged 40Neq+ (q = 3-8) and 129Xeq+ (q = 10-30) ion-induced secondary electron emission on the tungsten and highly oriented pyrolytic graphite (HOPG) surfaces. The total secondary electron yield is measured as a function of the potential energy of incident ion. The experimental data is used to separate contributions of kinetic and potential electron yields. We estimate roughly 10\% of ion's potential energy is consumed in potential electron emission. The rest of the ion's potential energy is responsible for the sputtering and material modification.",

keywords = "Electron emission, Highly charged ions",

author = "Yuyu Wang and Yongtao Zhao and Jianrong Sun and A. Qayyum and Jie Liu and Zhiguang Wang and Guoqing Xiao",

year = "2011",

month = may,

day = "1",

doi = "10.1016/j.nimb.2010.11.071",

language = "英语",

volume = "269",

pages = "977--980",

journal = "Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms",

issn = "0168-583X",

publisher = "Elsevier B.V.",

number = "9",

}

Electron emission by highly charged neon and xenon ions on fusion-relevant tungsten and graphite surfaces. / Wang, Yuyu; Zhao, Yongtao; Sun, Jianrong et al.
In: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 269, No. 9, 01.05.2011, p. 977-980.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Electron emission by highly charged neon and xenon ions on fusion-relevant tungsten and graphite surfaces

AU - Wang, Yuyu

AU - Zhao, Yongtao

AU - Sun, Jianrong

AU - Qayyum, A.

AU - Liu, Jie

AU - Wang, Zhiguang

AU - Xiao, Guoqing

PY - 2011/5/1

Y1 - 2011/5/1

N2 - Here we report highly charged 40Neq+ (q = 3-8) and 129Xeq+ (q = 10-30) ion-induced secondary electron emission on the tungsten and highly oriented pyrolytic graphite (HOPG) surfaces. The total secondary electron yield is measured as a function of the potential energy of incident ion. The experimental data is used to separate contributions of kinetic and potential electron yields. We estimate roughly 10% of ion's potential energy is consumed in potential electron emission. The rest of the ion's potential energy is responsible for the sputtering and material modification.

AB - Here we report highly charged 40Neq+ (q = 3-8) and 129Xeq+ (q = 10-30) ion-induced secondary electron emission on the tungsten and highly oriented pyrolytic graphite (HOPG) surfaces. The total secondary electron yield is measured as a function of the potential energy of incident ion. The experimental data is used to separate contributions of kinetic and potential electron yields. We estimate roughly 10% of ion's potential energy is consumed in potential electron emission. The rest of the ion's potential energy is responsible for the sputtering and material modification.

KW - Electron emission

KW - Highly charged ions

UR - https://www.scopus.com/pages/publications/79953741944

U2 - 10.1016/j.nimb.2010.11.071

DO - 10.1016/j.nimb.2010.11.071

M3 - 文章

AN - SCOPUS:79953741944

SN - 0168-583X

VL - 269

SP - 977

EP - 980

JO - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

JF - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

IS - 9

ER -

Electron emission by highly charged neon and xenon ions on fusion-relevant tungsten and graphite surfaces

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Keywords

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