Electrochemical migration of tin in thin electrolyte layer containing chloride ions

Xiankang Zhong; Guoan Zhang; Yubing Qiu; Zhenyu Chen; Xingpeng Guo

doi:10.1016/j.corsci.2013.04.015

Electrochemical migration of tin in thin electrolyte layer containing chloride ions

Xiankang Zhong
, Guoan Zhang
, Yubing Qiu
, Zhenyu Chen
, Xingpeng Guo

Huazhong University of Science and Technology

Research output: Contribution to journal › Article › peer-review

75 Scopus citations

Abstract

The electrochemical migration of tin in thin electrolyte layers (TELs) containing chloride ions was investigated using in situ electrochemical and optical techniques, as well as ex situ characterization. The results show that tin dendrites co-exist with precipitates in both low and high chloride concentrations, however, in intermediate chloride concentration, no tin dendrites but only precipitates mainly consisting of stannic compounds were observed. The higher bias voltage is applied, the faster rate of ions migration is. Mechanisms have also been proposed to explain the electrochemical migration behaviors.

Original language	English
Pages (from-to)	71-82
Number of pages	12
Journal	Corrosion Science
Volume	74
DOIs	https://doi.org/10.1016/j.corsci.2013.04.015
State	Published - Sep 2013
Externally published	Yes

Keywords

A. Tin
B. SEM
B. XPS
C. Anodic dissolution

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10.1016/j.corsci.2013.04.015

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title = "Electrochemical migration of tin in thin electrolyte layer containing chloride ions",

abstract = "The electrochemical migration of tin in thin electrolyte layers (TELs) containing chloride ions was investigated using in situ electrochemical and optical techniques, as well as ex situ characterization. The results show that tin dendrites co-exist with precipitates in both low and high chloride concentrations, however, in intermediate chloride concentration, no tin dendrites but only precipitates mainly consisting of stannic compounds were observed. The higher bias voltage is applied, the faster rate of ions migration is. Mechanisms have also been proposed to explain the electrochemical migration behaviors.",

keywords = "A. Tin, B. SEM, B. XPS, C. Anodic dissolution",

author = "Xiankang Zhong and Guoan Zhang and Yubing Qiu and Zhenyu Chen and Xingpeng Guo",

year = "2013",

month = sep,

doi = "10.1016/j.corsci.2013.04.015",

language = "英语",

volume = "74",

pages = "71--82",

journal = "Corrosion Science",

issn = "0010-938X",

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TY - JOUR

T1 - Electrochemical migration of tin in thin electrolyte layer containing chloride ions

AU - Zhong, Xiankang

AU - Zhang, Guoan

AU - Qiu, Yubing

AU - Chen, Zhenyu

AU - Guo, Xingpeng

PY - 2013/9

Y1 - 2013/9

N2 - The electrochemical migration of tin in thin electrolyte layers (TELs) containing chloride ions was investigated using in situ electrochemical and optical techniques, as well as ex situ characterization. The results show that tin dendrites co-exist with precipitates in both low and high chloride concentrations, however, in intermediate chloride concentration, no tin dendrites but only precipitates mainly consisting of stannic compounds were observed. The higher bias voltage is applied, the faster rate of ions migration is. Mechanisms have also been proposed to explain the electrochemical migration behaviors.

AB - The electrochemical migration of tin in thin electrolyte layers (TELs) containing chloride ions was investigated using in situ electrochemical and optical techniques, as well as ex situ characterization. The results show that tin dendrites co-exist with precipitates in both low and high chloride concentrations, however, in intermediate chloride concentration, no tin dendrites but only precipitates mainly consisting of stannic compounds were observed. The higher bias voltage is applied, the faster rate of ions migration is. Mechanisms have also been proposed to explain the electrochemical migration behaviors.

KW - A. Tin

KW - B. SEM

KW - B. XPS

KW - C. Anodic dissolution

UR - https://www.scopus.com/pages/publications/84879419362

U2 - 10.1016/j.corsci.2013.04.015

DO - 10.1016/j.corsci.2013.04.015

M3 - 文章

AN - SCOPUS:84879419362

SN - 0010-938X

VL - 74

SP - 71

EP - 82

JO - Corrosion Science

JF - Corrosion Science

ER -

Electrochemical migration of tin in thin electrolyte layer containing chloride ions

Abstract

Keywords

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