TY - JOUR
T1 - Electrical edge effect induced photocurrent overestimation in low-light organic photovoltaics
AU - Zhou, Xiaobo
AU - Zhao, Chao
AU - Alotaibi, Awwad Nasser
AU - Wu, Hongbo
AU - Naveed, Hafiz Bilal
AU - Lin, Baojun
AU - Zhou, Ke
AU - Ma, Zaifei
AU - Collins, Brian A.
AU - Ma, Wei
N1 - Publisher Copyright:
© 2022 Elsevier Inc.
PY - 2022/8/17
Y1 - 2022/8/17
N2 - In many literatures, the short-circuit current (JSC) of indoor organic photovoltaics is overestimated, leading to severely wrong device performance evaluation and analysis. In this work, based on the equivalent circuit model, we demonstrate that electrical edge effect is sensitive to both transverse surface resistance and light intensity. At low light intensity, the electrical edge effect could lead to JSC being significantly overestimated, i.e., by 100% and even more. We show that for a PM6:Y6 device capped with a MoOX layer, when measured under 0.01 sun, the usually overlooked interface doping mechanism would lead to JSC and PCE overestimation by 51% and 15%, respectively. Besides, we show that the magnitude of JSC overestimation drastically increases with high photoactive-layer surface roughness. This work emphasized the significant electrical edge effect on JSC evaluations for low-light solar cells and is conducive to understanding the intrinsic mechanism of edge effect, promoting a healthier development of organic photovoltaics.
AB - In many literatures, the short-circuit current (JSC) of indoor organic photovoltaics is overestimated, leading to severely wrong device performance evaluation and analysis. In this work, based on the equivalent circuit model, we demonstrate that electrical edge effect is sensitive to both transverse surface resistance and light intensity. At low light intensity, the electrical edge effect could lead to JSC being significantly overestimated, i.e., by 100% and even more. We show that for a PM6:Y6 device capped with a MoOX layer, when measured under 0.01 sun, the usually overlooked interface doping mechanism would lead to JSC and PCE overestimation by 51% and 15%, respectively. Besides, we show that the magnitude of JSC overestimation drastically increases with high photoactive-layer surface roughness. This work emphasized the significant electrical edge effect on JSC evaluations for low-light solar cells and is conducive to understanding the intrinsic mechanism of edge effect, promoting a healthier development of organic photovoltaics.
KW - edge effect
KW - interface doping
KW - low light intensity
KW - organic photovoltaics
KW - photocurrent overestimation
KW - resistivity
UR - https://www.scopus.com/pages/publications/85135968032
U2 - 10.1016/j.joule.2022.06.008
DO - 10.1016/j.joule.2022.06.008
M3 - 文章
AN - SCOPUS:85135968032
SN - 2542-4351
VL - 6
SP - 1904
EP - 1917
JO - Joule
JF - Joule
IS - 8
ER -