Abstract
Polyimide (PI)-matrix composite films containing titanium dioxide (TiO 2) nanoparticles and layered montmorillonite (MMT) have been fabricated by employing in-situ polymerization and their microstructure has been investigated by synchrotron radiation small angle X-ray scattering, wide-angle X-ray diffraction and scanning electron microscopy. The effects of mixture doping concentration on volume resistivity, loss tangent, permittivity, and breakdown field strength are analyzed. The breakdown field strength of TiO 2 and MMT doped PI nanocomposite (PTM) shows a maximum value at the inorganic content of 5 wt.%, which is 10% higher than that of comparable two-component PI/TiO2 nanocomposite films. Meanwhile, the tri-layered PTM/PI/PTM nanocomposite film, prepared by in-situ polymerization, exhibits improved electrical properties than that of the monolayer PTM film.
| Original language | English |
|---|---|
| Pages (from-to) | 352-356 |
| Number of pages | 5 |
| Journal | Thin Solid Films |
| Volume | 544 |
| DOIs | |
| State | Published - 1 Oct 2013 |
| Externally published | Yes |
Keywords
- Electrical and mechanical properties
- Montmorillonite
- Nanocomposite film
- Polyimide matrix
- Titanium dioxide nanoparticles