Efficient Repair Analysis Algorithm Exploration for Memory with Redundancy and In-Memory ECC

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Abstract

In-memory error correction code (ECC) is a promising technique to improve the yield and reliability of high density memory design. However, the use of in-memory ECC poses a new problem to memory repair analysis algorithm, which has not been explored before. This article first makes a quantitative evaluation and demonstrates that the straightforward algorithms for memory with redundancy and in-memory ECC have serious deficiency on either repair rate or repair analysis speed. Accordingly, an optimal repair analysis algorithm that leverages preprocessing/filter algorithms, hybrid search tree, and depth-first search strategy is proposed to achieve low computational complexity and optimal repair rate in the meantime. In addition, a heuristic repair analysis algorithm that uses a greedy strategy is proposed to efficiently find repair solutions. Experimental results demonstrate that the proposed optimal repair analysis algorithm can achieve optimal repair rate and increase the repair analysis speed by up to $105\times$105× compared with the straightforward exhaustive search algorithm. The proposed heuristic repair analysis algorithm is approximately 28 percent faster than the proposed optimal algorithm, at the expense of 5.8 percent repair rate loss.

Original languageEnglish
Article number9099028
Pages (from-to)775-788
Number of pages14
JournalIEEE Transactions on Computers
Volume70
Issue number5
DOIs
StatePublished - 1 May 2021

Keywords

  • Memory repair
  • in-memory ECC
  • reliability
  • repair analysis algorithm
  • yield

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