Effects of thickness on structures and electrical properties of Mn-doped K0.5Na0.5NbO3 films

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Abstract

Lead-free ferroelectric Mn-doped K0.5Na0.5NbO 3 (KNN) films with different thicknesses were deposited on Pt(111)Ti/SiO2 /Si (100) substrates by a modified chemical solution deposition method. Single perovskite phase with (100)-texture was obtained in all films, whereas with the increase in thickness, the texture and morphologies were not dramatically changed. Dielectric and ferroelectric properties of KNN films were analyzed as a function of the thickness. It is found that the intrinsic and extrinsic contributions to the dielectric constant of KNN films are both increased. However, the dielectric constant of KNN films did not monotonously increase with the thickness increased. Eliminated the effect of leakage current of KNN film with the thickness of 0.65 lm, the coercive electric fields lowered and the remnant polarization of KNN films improved with increasing the thickness, indicating the improved ferroelectric properties of KNN films by increasing the thickness.

Original languageEnglish
Pages (from-to)759-763
Number of pages5
JournalJournal of Alloys and Compounds
Volume582
DOIs
StatePublished - 2014

Keywords

  • Coercive electric-field
  • Dielectric constant
  • Mn-doped KNN films
  • Remnant polarization
  • Thickness dependence

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