Effects of annealing on dielectric and ferroelectric properties in Pb(In_1/2Nb_1/2)O₃-xPbTiO₃(x≤0.30) ceramics

(1-x)Pb(In_1/2Nb_1/2)O₃-xPbTiO₃ (PIN-xPT, x=0.05, 0.10, 0.15, 0.20, 0.25 and 0.30) ceramics were prepared by wolframite method and then annealed at 650 °C for 24 h. Effects of PT contents on the phase structure in these ceramics were analyzed by XRD. The samples with x≥ 0.15 were of single phase perovskite structure. The stability of perovskite phase structure for the samples with xâ‰&0.10 was improved by using thermal annealing. Dielectric and ferroelectric properties of these samples were systematically investigated. It was found that the dielectric constants of the PIN-PT ceramics were increased within a wide temperature range and the phase transition temperatures shifted to low temperature after annealing. Hysteresis loops in PIN-xPT(x<0.20) ceramics had fake polarization and the peaks of electrical current appeared at the maximum applied field. The effects of PT content and annealing on dielectric and ferroelectric properties in PIN-PT ceramics are discussed.